
A designer's guide to built-in self-test
Charles E. StroudAñadir a mi colección
Formato

Añadir a mi colección
Formato
También te puede gustar
Integration of test with design and manufacturing
International Test Conference (18th 1987 Washington, D.C.)
1987
Añadir2008 IEEE 14th International Mixed-signals, Sensors, and Systems Test Workshop
IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (14th 2008 Vancouver, B.C.)
2008
AñadirInternational Test Conference, 1991
International Test Conference (22nd 1991 Nashville, Tenn.)
1991
Añadir