Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems | Libros

Calibration of x-ray and gamma-ray measuring instruments

Paul J. Lamperti

1988

Recommended Practice

American Institute of Aeronautics and As

2002

Basic Metrology for ISO 9000 Certification

G. M. S. de Silva

2001

Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems

James E. Potzick

1997

Calibration of a 90 ̊V-notch weir using parameters other than upstream head

Robert Eli

1980

Post-launch calibration of satellite sensors

Amelia M. Budge

2004

Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems

Carol F. Vezzetti

1992

National Voluntary Laboratory Accreditation Program

NVLAP (Program : U.S.)

1994